IR-VASE® is a unique spectroscopic ellipsometer that merges FTIR’s chemical sensitivity with precise thin film analysis. Covering a broad spectral range, it’s ideal for characterizing both surfaces and bulk materials in research and industrial settings.

Perkin Elmer FT-IR Spectrum Two
Spectrum Two™ is a compact and durable FT-IR spectrometer well-suited for nanocharacterization, enabling precise infrared analysis of materials at the molecular level. Its ease of use and high sensitivity make it an effective tool for probing chemical composition and structure in nanoscale research.

Prices
First sample is FREE!