Armando Rúa de la Asunción

Material Physics Group

Armando Rúa de la Asunción is an Associate Professor in the Physics Department at the University of Puerto Rico-Mayagüez (UPRM). He holds a Ph.D. from the Graduate Center and Hunter College of City University of New York, a Master’s degree in Physics, and a BSc in Mechanical Engineering from UPRM. Originally from Barranquilla, Colombia, Rúa completed his B.S. in Math and Physics at the University of Atlántico. Dr. Rúa’s research focuses on the physics and applications of materials with Metal-Insulator Transitions (MITs), with a particular emphasis on vanadium oxides. His interests extend to other areas, including superconductors, low-dimensional materials, neuromorphic devices, and material characterization under extreme environmental conditions. Professor Rúa was named one of the 2023 Moore Foundation Experimental Physics Investigators

Publications

Publications

Our Sponsors

Facilities

Pulsed Laser Deposition

We offer two PLD systems. System #1 deposits oxide materials and includes a 4-target turret, mass flow controllers, residual gas analyzer, and a substrate heater up to 800°C in O2 atmosphere. System #2 is for nitride semiconductors with UHV chamber, nitrogen beam source, residual gas analyzer, electron gun evaporation source, and a sample heater over 800°C in vacuum. Discover our advanced deposition capabilities!

X-ray Diffraction

We offer high-resolution X-ray diffraction with the Bruker-AXS D8 Discover system, ideal for thin film studies. It includes a multilayer parabolic mirror for increased intensity and collimation, and a Ge crystal monochromator for better resolution. The Huber goniometer provides 7 degrees of freedom with computer-controlled movements and 0.0001° resolution. We also perform grazing-incidence reflectometry measurements.

Other Facilities

We offer electronic characterization of materials at temperatures down to 10 K and magnetic fields over 1 T. Our advanced instruments include current sources, nanovoltmeters, cryostats, and temperature controllers. We also measure dielectric permittivities and piezoelectric properties with high precision. Our 44-wavelength ellipsometer analyzes thin films. The entire process is controlled by an in-house developed LabView system.

Students interested in becoming part of our group should contact us by email to discuss the research opportunities we have available.