|DIFRACTOMETRY AND COMPLEMENTARY TECHNIQUES
|Study of the theory, practice, and applications of X-ray diffraction and other complementary techniques, which will allow the identification of the most suitable characterization techniques for the type of information (morphological, structural, qualitative, and quantitative) required for materials of interest. Discussion of experimental methods and applications of electron and neutron diffraction techniques, as well as electron microscopy. Presentation of the principles of complementary techniques such as SPM, XPS, Auger, Mossbauer, solid-state nuclear magnetic resonance, and SIMMS and their application to structural problems in the solid state.
|Passing Grade : C
|Prerequisites: Director’s permission